Microcontrollers and Interfacing

Chapter 6
Analog and Mixed-Signal Interfacing

Bachelor Program in Mechatronics Engineering
Microcontrollers and Interfacing   •   Bachelor

Analog and Mixed-Signal Interfacing

Introduction

Microcontrollers operate primarily with digital words, yet most engineering variables—temperature, pressure, position, light, sound, current, and speed—are continuous physical quantities. Analog and mixed-signal interfacing provides the bridge between these physical variables and digital computation. It also permits a microcontroller to control analog actuators through pulse-width modulation, digital-to-analog conversion, and feedback systems.

A reliable interface is more than an ADC connected to a sensor. It includes transduction, protection, amplification, filtering, sampling, quantization, reference generation, grounding, calibration, firmware, and verification. Errors introduced at any stage can limit the accuracy of the complete system.

This chapter develops the theory and practice of acquiring and generating analog signals using microcontrollers. The emphasis is on design decisions, assumptions, limitations, and methods for obtaining dependable measurements in real mechatronic systems.

Learning Objectives

After studying this chapter, a student should be able to:

  1. Explain sampling, aliasing, quantization, resolution, and conversion accuracy.
  2. Select and configure ADCs, DACs, comparators, references, and signal-conditioning circuits.
  3. Design basic voltage-divider, amplifier, anti-aliasing, reconstruction, and active-filter circuits.
  4. Estimate quantization noise, settling time, conversion error, and signal-to-noise performance.
  5. Apply calibration, grounding, shielding, averaging, and digital filtering techniques.
  6. Diagnose mixed-signal faults in a practical embedded system.

1. The Mixed-Signal Measurement Chain

A typical measurement system follows this sequence:

physical quantity → sensor or transducer → protection → signal conditioning → anti-alias filter → sample-and-hold → ADC → digital processing → actuator or communication.

A sensor converts a physical variable into an electrical signal. Signal conditioning may include excitation, amplification, level shifting, linearization, isolation, and filtering. The ADC converts the conditioned voltage into a digital code. Firmware then scales, filters, diagnoses, and uses the result.

For example, a thermistor may produce a resistance change rather than a voltage. A voltage divider converts resistance to voltage, an amplifier may increase sensitivity, and an ADC measures the resulting voltage. The software then converts the code into resistance and temperature using a calibration model.

The reverse path uses a DAC, PWM output, or comparator to influence an analog process. A motor controller, valve driver, or power converter may use a digital command to generate a continuously varying physical response.

A useful design principle is to allocate the error budget before selecting components. If the required overall accuracy is ±0.5%, the sensor, reference, amplifier, resistor network, ADC, noise, and calibration residuals must collectively remain within that limit.

2. Voltage, References, and Signal Conditioning

2.1 ADC input range and reference

An ADC maps an input voltage range to a finite set of codes. In a unipolar converter, the input normally lies between 0 V and a positive reference voltage VREF. The reference is not merely a supply voltage; it establishes the scale against which the input is measured.

For an ideal N-bit ADC with input range 0 to VREF, the number of codes is 2N. The code width, often called one least significant bit, is approximately:

q = VREF / 2N

Here q is in volts per code, VREF is the reference voltage in volts, and N is the resolution in bits. The exact transition locations depend on the ADC architecture and code convention; therefore, q is a nominal step size rather than a complete accuracy specification.

For an ideal unipolar ADC, a measured code can be converted approximately to voltage by:

VIN ≈ Code × VREF / (2N − 1)

where Code ranges from 0 to 2N−1. Some data sheets instead define the conversion using 2N in the denominator. The device data sheet and transfer-curve convention must therefore be followed in precision work.

2.2 Scaling and level shifting

A sensor output may exceed the ADC range or use only a small part of it. A resistor divider reduces voltage according to:

VOUT = VIN × R2 / (R1 + R2)

where R1 is connected to the input, R2 to ground, and both resistances are in ohms. The divider is valid under the assumption that the load resistance is much larger than R2. If the ADC input or another circuit loads the divider, the effective lower resistance becomes the parallel combination of R2 and the load.

A non-inverting operational-amplifier stage has ideal closed-loop gain:

AV = 1 + RF / RG

where RF is the feedback resistor and RG connects the inverting input to the reference node. This expression assumes negative feedback, operation within the amplifier’s output and input common-mode ranges, and sufficiently high open-loop gain.

If a bipolar sensor signal must be measured by a unipolar ADC, a reference offset can be added:

VOUT = VBIAS + AV × VIN

The bias and gain must be chosen so that the full expected sensor range remains inside the ADC input range, including tolerances and transients.

2.3 Loading, protection, and input impedance

A conditioning circuit must not substantially alter the sensor. High-impedance sensors generally require a buffer amplifier. Protection may include a series resistor, a transient suppressor, and clamps to permitted rails. Protection components must be selected so that fault currents remain safe and their leakage does not create unacceptable measurement error.

A series resistor placed before an ADC also interacts with the ADC’s internal sampling capacitor. If the source impedance is too high, the capacitor may not charge fully during the acquisition interval. The result is a code that depends on the previous channel or previous voltage. The remedy is a lower source impedance, a buffer, a longer acquisition time, or a suitable capacitor at the ADC pin—provided that the resulting RC network is stable and adequately filtered.

3. Sampling Theory

3.1 Sampling and aliasing

Sampling records a continuous-time signal at discrete instants separated by the sampling period TS. The sampling frequency is:

fS = 1 / TS

where fS is in hertz and TS is in seconds.

The Nyquist–Shannon sampling condition states that a band-limited signal with highest frequency fMAX can be reconstructed ideally if:

fS > 2 fMAX

This condition assumes ideal sampling, a strictly band-limited signal, and ideal reconstruction. In real systems, the sampling frequency is usually chosen significantly above twice the useful bandwidth to allow for filter transition bands and nonidealities.

Aliasing occurs when frequency components above the usable Nyquist region appear as lower-frequency components after sampling. Once aliased, the original frequency cannot generally be recovered by digital processing. An analog anti-aliasing filter must therefore attenuate unwanted components before the ADC.

For a sinusoid sampled at frequency fS, frequencies separated by integer multiples of fS produce the same sampled sequence. A practical expression for an aliased frequency is the frequency remaining after folding the input frequency around multiples of fS/2.

3.2 Sample-and-hold behavior

Many ADCs use a sample-and-hold circuit. During acquisition, an internal capacitor tracks the input; during conversion, the capacitor is isolated and converted. The input must remain sufficiently stable during acquisition and conversion. A changing input therefore produces aperture error, while an impedance that is too high produces incomplete settling.

For a first-order RC response, the remaining fraction of an initial voltage error after time t is:

e(t) = e(0) × exp(−t / RC)

where R is resistance in ohms, C is capacitance in farads, and t is time in seconds. To reduce the error to a specified fraction, the acquisition time must be several time constants τ = RC. The required value must be checked against the ADC data sheet.

3.3 Sampling jitter

Timing uncertainty produces voltage error when the signal is changing rapidly. For a sinusoid of peak amplitude A and frequency f, the approximate rms jitter-induced signal-to-noise ratio is:

SNRJ ≈ −20 log10(2π f A? / A?)

More usefully, for rms timing jitter σt, the sinusoidal jitter limit is:

SNRJ ≈ −20 log10(2π fIN σt)

where fIN is the input frequency in hertz and σt is rms timing uncertainty in seconds. This relation assumes small timing errors and a sinusoidal input; amplitude cancels because both signal slope and signal amplitude scale together.

4. Quantization and ADC Performance

4.1 Quantization

Quantization replaces a continuous amplitude with one of a finite number of codes. The ideal quantization error lies approximately between −q/2 and +q/2 for a mid-tread interpretation. If the error is treated as uniformly distributed and uncorrelated with the input, its rms value is:

σQ = q / √12

This model is most appropriate when the signal exercises many codes and is not correlated with the quantization pattern. For a full-scale sinusoid, the ideal quantization signal-to-noise ratio is approximately:

SNRQ ≈ 6.02N + 1.76 dB

The equation excludes reference noise, thermal noise, distortion, jitter, and nonlinearity. It is therefore a theoretical benchmark, not a guarantee of data-sheet performance.

4.2 ADC architectures

Successive-approximation-register (SAR) ADCs use a sample-and-hold, comparator, internal DAC, and binary search. They provide a useful compromise among speed, resolution, power, and cost and are common in microcontrollers.

Oversampling ADCs, including sigma-delta converters, use high-rate quantization and digital filtering. They can provide high resolution and excellent rejection of out-of-band noise, often at lower bandwidth and with conversion latency.

Flash ADCs use many comparators in parallel and offer very high speed, but hardware complexity and power increase rapidly with resolution. Dual-slope converters are highly accurate and noise-resistant at low speed, making them common in digital instruments.

4.3 Important ADC specifications

Resolution describes code density, but accuracy also depends on:

  • Offset error: displacement of the transfer curve from the ideal curve.
  • Gain error: slope error after offset is removed.
  • Integral nonlinearity (INL): deviation of actual code transitions from a reference straight line.
  • Differential nonlinearity (DNL): deviation of each code width from one ideal step.
  • Missing codes: absent output codes, often associated with excessive DNL.
  • Effective number of bits (ENOB): resolution inferred from measured noise and distortion.
  • Aperture uncertainty: uncertainty in the effective sampling instant.
  • Conversion latency and throughput: delay and maximum sustainable conversion rate.

A high nominal resolution is not useful if the reference is noisy, the layout is poor, or the sensor signal occupies only a few codes.

5. DACs, PWM, and Comparators

5.1 Digital-to-analog conversion

An ideal N-bit unipolar DAC produces a voltage proportional to its input code. A common approximation is:

VOUT ≈ Code × VREF / (2N − 1)

The output may be a voltage, current, or switched waveform. Important DAC specifications include settling time, monotonicity, integral and differential nonlinearity, offset, gain error, glitch impulse, reference sensitivity, and output-drive capability.

A resistor-string DAC is inherently monotonic but may require many resistors. An R–2R ladder uses repeated resistor values and can be efficient, but switch resistance and matching affect accuracy. External DACs are preferable when the microcontroller’s PWM output is insufficiently smooth or stable.

5.2 PWM as an approximate DAC

Pulse-width modulation applies a digital waveform whose duty ratio controls the average value. For an ideal low-pass load or filter, the average output of a 0-to-VDD PWM waveform is:

VAVG = D × VDD

where D is duty ratio from 0 to 1. PWM ripple depends on frequency, load, and filter design. PWM is often excellent for motor control and power conversion, but it is not equivalent to a precision DAC unless ripple, switching noise, clock accuracy, and load dynamics are acceptable.

5.3 Comparators

A comparator produces a digital indication of whether one input is greater than another. With a reference VREF, the ideal output changes state when VIN = VREF. Hysteresis prevents rapid switching caused by noise near the threshold. A Schmitt-trigger comparator with upper and lower thresholds is useful for zero-crossing detection, limit switches, relaxation oscillators, and event timing.

Comparator inputs and outputs may have propagation delay, input offset, common-mode limits, and output saturation. These specifications matter in high-speed control and overcurrent protection.

6. References, Noise, and Grounding

6.1 Voltage references

Reference quality directly affects conversion accuracy. A reference has initial accuracy, temperature coefficient, long-term drift, output noise, load regulation, and dynamic response. A ratiometric system can reduce reference sensitivity: if both sensor excitation and ADC reference derive from the same source, their common variation may cancel in the measured ratio.

Reference decoupling must follow the converter data sheet. A capacitor placed too far away, a shared noisy return path, or an unsuitable capacitor dielectric can reduce reference stability.

6.2 Noise sources

Analog interfaces are affected by thermal noise, shot noise, flicker noise, electromagnetic interference, switching transients, power-supply ripple, ground bounce, and quantization noise. Thermal noise voltage density of a resistor is commonly expressed as:

en = √(4 k T R B)

where k is Boltzmann’s constant in joules per kelvin, T is absolute temperature in kelvin, R is resistance in ohms, and B is bandwidth in hertz. This equation applies to the rms noise across an ideal resistor over bandwidth B. Real circuits add amplifier and environmental noise.

Noise reduction methods include reducing unnecessary bandwidth, using differential measurement, separating high-current and low-level return paths, using short analog traces, shielding sensitive conductors, placing decoupling capacitors close to device pins, and synchronizing ADC sampling away from large switching edges.

Ground is not automatically an equipotential conductor. Voltage drops across shared impedance create errors. A star connection, carefully planned ground plane, or differential ADC input can be preferable, depending on current paths and board architecture.

7. Analog and Digital Filtering

7.1 First-order low-pass filter

A passive RC low-pass filter has cutoff frequency:

fC = 1 / (2πRC)

where R is in ohms, C is in farads, and fC is in hertz. Its magnitude response is:

|H(f)| = 1 / √(1 + (f/fC)2)

At the cutoff frequency, the magnitude is approximately 0.707 of the low-frequency value, equivalent to −3.01 dB. The filter attenuates high-frequency noise but may slow the signal and introduce phase shift.

An anti-alias filter must be placed before sampling. Its cutoff cannot simply be set equal to half the sampling frequency unless the required attenuation and passband are compatible. Higher-order active filters provide a sharper transition but introduce component tolerances, op-amp limitations, and possible stability issues.

7.2 Digital filtering

A moving-average filter of length M is:

y[n] = (1/M) ∑k=0M−1 x[n−k]

where x[n is the current sample and y[n is the filtered output. For uncorrelated zero-mean noise, the noise standard deviation is reduced ideally by approximately √M, but the filter introduces delay and reduces bandwidth. It does not repair aliasing that occurred before conversion.

A first-order exponential filter can be written:

y[n] = αx[n] + (1−α)y[n−1]

where 0 < α ≤ 1. Larger α gives faster response and less smoothing. The coefficient must be selected according to sample period, desired bandwidth, and control-loop stability.

8. Calibration and Error Compensation

Calibration establishes the relationship between measured code and a trusted physical quantity. A two-point linear calibration is:

y = a x + b

with:

a = (y2 − y1)/(x2 − x1), b = y1 − a x1

Here x is the uncalibrated measurement, y is the corrected value, and the two known calibration points are (x1,y1) and (x2,y2). The method assumes linearity over the operating range and stable conditions.

Calibration should distinguish repeatability, reproducibility, accuracy, and resolution. A calibration certificate does not remove installation errors, hysteresis, sensor aging, or environmental effects. Temperature compensation may require a polynomial, lookup table, or multidimensional model. Calibration data should be stored with version, date, units, reference standards, and uncertainty.

Firmware should detect out-of-range codes, disconnected sensors, stuck values, implausible rates of change, and reference failures. A measurement system that silently reports an invalid value is unsafe in many industrial applications.

9. Worked Example: Designing a Temperature Input

An illustrative design uses a sensor producing 0.20 V to 2.80 V over the required temperature range. A 12-bit ADC has a 3.30 V reference. The design must estimate code resolution and determine whether amplification is necessary.

The nominal ADC step is:

q = 3.30 V / 4096 = 0.0008057 V ≈ 0.806 mV

The sensor span is:

ΔVSENSOR = 2.80 V − 0.20 V = 2.60 V

The span occupies approximately:

2.60 V / 0.0008057 V ≈ 3228 codes

Thus, the sensor uses about 79% of the available code range. It does not require amplification merely to use the ADC, although the low end leaves unused codes below 0.20 V. If the sensor signal is noisy, an RC filter can be added, but its source resistance must remain compatible with ADC acquisition requirements.

Suppose the desired analog bandwidth is 20 Hz and the sampling rate is 1 kHz. A first-order anti-alias filter with a 50 Hz cutoff could be selected as a starting point. Choosing R = 3.3 kΩ gives:

C = 1/(2πRfC) = 1/(2π × 3300 Ω × 50 Hz) ≈ 0.964 µF

A standard 1.0 µF capacitor gives a cutoff close to 48.2 Hz. The final design must verify sensor loading, capacitor leakage, ADC acquisition settling, transient response, and attenuation at frequencies that could alias into the measurement band.

10. Applied Case: Servo-Axis Current Monitoring

Background

Consider an illustrative robotic servo axis with a 0–10 A motor current sensor. The controller must detect overloads quickly and also estimate average current for torque regulation. The microcontroller ADC range is 0–3.3 V, and the control firmware samples at 20 kHz.

Problem

The sensor output is 0.5 V at 0 A and 2.5 V at 10 A. PWM switching occurs at 20 kHz, with substantial spectral energy near the switching frequency and its harmonics. Direct connection could allow switching noise to corrupt the current estimate. The ADC input must also be protected against sensor faults and inductive transients.

Analysis and approach

The sensor span is 2.0 V, corresponding to 0.2 V/A. The signal occupies a safe portion of the ADC range, and its offset allows detection of some negative-going fault behavior without requiring a bipolar ADC. An RC network is designed to attenuate switching ripple while preserving the current-control bandwidth. Because the sampling rate is 20 kHz, the first anti-alias filter must attenuate frequencies above the usable Nyquist region; its cutoff is selected below several kilohertz after considering the required control bandwidth.

A buffer amplifier is used if the sensor output impedance and ADC acquisition requirement make direct driving unsuitable. The ADC reference is locally decoupled, and the analog ground return is routed separately from the high-current motor return before joining at a controlled point. Firmware performs a startup zero-current measurement, subtracts the offset, applies a calibrated gain, and checks for saturation and implausible rates of change.

A separate fast comparator monitors the current-sense signal against an overcurrent threshold. This path bypasses the slower digital averaging so that a hardware fault response is not delayed by filtering. Hysteresis is included to prevent chatter near the trip point.

Outcome and learning points

The design separates three functions: accurate measurement, noise reduction, and rapid protection. It does not rely on digital filtering to correct aliasing, nor on the ADC alone to provide overcurrent protection. Calibration is performed at zero current and at a known load current, while oscilloscope measurements verify settling, ripple, and fault timing.

The principal lesson is architectural: a robust mixed-signal system assigns each requirement—bandwidth, accuracy, safety, and response time—to an appropriate analog or digital mechanism.

11. Design Procedure and Best Practices

  1. Define the physical range, required bandwidth, accuracy, response time, and fault behavior.
  2. Select the sensor and identify its output impedance, noise, drift, excitation, and failure modes.
  3. Establish the ADC or DAC reference and calculate nominal resolution.
  4. Scale and bias the signal so normal and fault ranges are understood.
  5. Design protection before optimizing gain.
  6. Select an anti-alias filter from bandwidth and sampling requirements, not merely from convenience.
  7. Check amplifier input/output limits, noise, offset, slew rate, stability, and supply rails.
  8. Confirm ADC acquisition time and source impedance for every channel.
  9. Separate switching-current paths from sensitive analog paths and provide local decoupling.
  10. Use hardware comparators for time-critical protection.
  11. Calibrate with traceable or sufficiently accurate standards and record uncertainty.
  12. Validate using static tests, swept inputs, step responses, temperature variation, supply variation, and fault injection.

12. Limitations, Safety, and Contemporary Developments

Analog accuracy is limited by component tolerances, temperature, aging, interference, and assumptions in the sensor model. Digital resolution cannot compensate for a noisy or unstable reference. Filtering improves noise performance but introduces delay; excessive delay can destabilize a control loop. Averaging improves random-noise precision but does not remove systematic error or aliasing.

Systems connected to hazardous voltages require isolation, creepage and clearance, appropriately rated protection, and compliance with relevant electrical-safety standards. Measurement data used in safety-related decisions should include plausibility checks and defined behavior on sensor failure. Privacy is relevant when analog interfaces measure biomedical or environmental variables linked to individuals; data collection and retention should be proportionate and governed.

Contemporary microcontrollers increasingly integrate programmable-gain amplifiers, oversampling ADCs, differential inputs, hardware filters, digital signal-processing blocks, and analog watchdogs. Machine-learning methods may assist sensor diagnostics or nonlinear compensation, but they do not eliminate the need for sound sampling, calibration, traceability, and fault containment. Any learned compensation should be validated over the full operating envelope and monitored for extrapolation.

Chapter Summary

Analog and mixed-signal interfacing connects continuous physical processes with digital control. The ADC reference defines the voltage scale, while resolution, quantization, linearity, noise, acquisition settling, and timing determine practical performance. Sampling must satisfy bandwidth requirements, and anti-alias filtering must occur before conversion because digital processing cannot recover aliased information.

Signal conditioning includes scaling, buffering, amplification, level shifting, protection, and filtering. DACs and PWM outputs generate analog-equivalent commands, while comparators provide fast threshold decisions and protection. References, grounding, layout, shielding, decoupling, and bandwidth management are as important as converter resolution. Calibration corrects identifiable offset and gain errors but must be supported by uncertainty analysis and fault detection.

A professional design begins with requirements and an error budget, separates measurement from protection, verifies data-sheet conditions, and validates the complete chain under realistic environmental and electrical conditions.

Key Terms

Sampling: Recording a continuous-time signal at discrete time intervals.

Nyquist frequency: One-half of the sampling frequency.

Aliasing: Misrepresentation of an input frequency as a different frequency after sampling.

Quantization: Mapping a continuous amplitude to a finite set of digital codes.

LSB: The nominal voltage step represented by one ADC code.

Reference voltage: The voltage establishing the scale of an ADC or DAC.

ADC: An analog-to-digital converter.

DAC: A digital-to-analog converter.

SAR ADC: An ADC using successive approximation and an internal DAC.

INL: Deviation of converter transfer behavior from a reference straight line.

DNL: Deviation of an individual code width from its ideal width.

Sample-and-hold: A circuit that captures and temporarily maintains an analog value.

Anti-alias filter: An analog filter that attenuates frequencies before sampling.

Ratiometric measurement: A measurement in which sensor excitation and reference share a scale.

Comparator: A circuit that indicates which of two input voltages is larger.

Hysteresis: Deliberate separation between switching thresholds.

Quantization noise: Error associated with finite-amplitude code representation.

Calibration: Comparison with known standards to determine and correct measurement error.

ENOB: Effective number of bits inferred from actual converter performance.

PWM: Pulse-width modulation used to control average power or approximate an analog command.

Review Questions

Short Answer Questions

  1. What is the purpose of an anti-aliasing filter?
  2. Distinguish ADC resolution from ADC accuracy.
  3. Why can a high source impedance cause errors in an ADC measurement?
  4. What is the function of hysteresis in a comparator?
  5. State two advantages of ratiometric measurement.

Long Answer Questions

  1. Explain the complete analog measurement chain from sensor to microcontroller, including protection, conditioning, filtering, conversion, and calibration.
  2. Describe quantization error and derive the ideal rms quantization-noise expression under the uniform-error assumption.
  3. Compare SAR, flash, and sigma-delta ADCs in terms of speed, resolution, complexity, and typical applications.
  4. Explain how grounding, shielding, decoupling, and bandwidth selection influence mixed-signal accuracy.
  5. Discuss why PWM is useful as an analog-output technique and identify conditions under which an external DAC is preferable.

Analytical / Application Questions

  1. A 10-bit ADC uses a 5.00 V reference. Calculate its nominal code step and estimate the code produced by a 2.00 V input using the stated approximation. Discuss one reason the actual result may differ.
  2. Design a first-order RC low-pass filter with a cutoff near 100 Hz using a 10 kΩ resistor. Calculate the required capacitance and identify two practical nonidealities that must be checked.
  3. A sensor signal contains useful content to 200 Hz and interference at 3 kHz. Propose a sampling frequency and analog/digital filtering strategy, explaining how aliasing and response delay would be managed.

Multiple Choice Questions with Answers

Question 1

An ideal 12-bit ADC uses a 3.3 V reference. What is its nominal voltage step size?

A. 0.806 mV

B. 3.30 mV

C. 12.0 mV

D. 1.21 V

Correct Answer: A. 0.806 mV

Question 2

What is the principal purpose of an analog anti-aliasing filter?

A. To increase ADC resolution

B. To attenuate unwanted frequencies before sampling

C. To convert digital codes into voltage

D. To calibrate the voltage reference

Correct Answer: B. To attenuate unwanted frequencies before sampling

Question 3

For a first-order RC low-pass filter, the cutoff frequency is determined by which expression?

A. RC/(2π)

B. 2πRC

C. 1/(2πRC)

D. R/(2πC)

Correct Answer: C. 1/(2πRC)

Question 4

Which ADC architecture commonly uses a binary-search process with an internal DAC and comparator?

A. Flash

B. Dual-slope

C. Sigma-delta only

D. Successive-approximation-register

Correct Answer: D. Successive-approximation-register

Question 5

A PWM output has duty ratio 0.25 and switches between 0 V and 12 V. What is its ideal average value after adequate low-pass filtering?

A. 0.25 V

B. 3 V

C. 6 V

D. 12 V

Correct Answer: B. 3 V

Question 6

Why is a buffer amplifier often placed between a high-impedance sensor and an ADC?

A. To increase aliasing

B. To provide isolation and a lower effective source impedance

C. To reduce the ADC reference voltage to zero

D. To eliminate the need for calibration

Correct Answer: B. To provide isolation and a lower effective source impedance

Question 7

What is the main benefit of comparator hysteresis in a noisy threshold detector?

A. It prevents repeated switching near the threshold

B. It increases ADC bit depth

C. It removes all sensor offset

D. It guarantees zero propagation delay

Correct Answer: A. It prevents repeated switching near the threshold

Question 8

Under the uniform quantization-error model, the rms quantization error is approximately:

A. q

B. q/2

C. q/√12

D. √12q

Correct Answer: C. q/√12

Question 9

Which error is primarily a slope error after offset has been removed?

A. Gain error

B. Aperture error

C. DNL only

D. Ground bounce

Correct Answer: A. Gain error

Question 10

Why can digital filtering not correct aliasing that has already occurred?

A. Digital filters cannot perform arithmetic

B. The original high-frequency information is indistinguishable from the aliased component

C. Digital filters always increase noise

D. Sampling occurs after digital filtering

Correct Answer: B. The original high-frequency information is indistinguishable from the aliased component

Microcontrollers and Interfacing
Chapter 6 of 14